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EMIF04-1502QCF
4 LINES LOW CAPACITANCE EMI FILTER AND ESD PROTECTION
IPADTM
MAIN PRODUCT CHARACTERISTICS: Where EMI filtering in ESD sensitive equipment is required :

8 7 6 5
LCD and camera for Mobile phones Computers and printers Communication systems MCU Boards
1 2 3 4
GND
DESCRIPTION The EMIF04-1502QCF is a 4 line highly integrated device designed to suppress EMI/RFI noise in all systems subjected to electromagnetic interferences. This filter includes an ESD protection circuitry, which prevents the device from destruction when subjected to ESD surges up 15kV on the input pins. BENEFITS

QFN 2x2mm 8 pins (Dot on package indicates pin 1) Table 1: Order Code Part Number EMIF04-1502QCF
Marking F4
Figure 1: Pin Configuration (back side)
Low-pass Filter Input Output
EMI symmetrical (I/O) low-pass filter High efficiency in EMI filtering Very low PCB space consuming: 2mm x 2mm Very thin package: 1 mm max. High efficiency in ESD suppression on input pins (IEC61000-4-2 level 4) High reliability offered by monolithic integration High reducing of parasitic elements through integration and wafer level packaging
1
Low-pass Filter Input Output
8
2
Low-pass Filter Input Output
7
3
Low-pass Filter Input Output
6
COMPLIES WITH THE FOLLOWING STANDARDS: IEC61000-4-2: Level 4 input pins 15kV (air discharge) 8kV (contact discharge)
4
Figure 2: Basic Cell Configuration
5
MIL STD 833E - Method 3015-6 Class 3
Input 1 C1 C2
Output 2
Typical line capacitance = 13pF @ 3V R = 160
TM: IPAD is a trademark of STMicroelectronics.
December 2004
REV. 1
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EMIF04-1502QCF
Table 2: Absolute Ratings (limiting values) Symbol Tj Top Tstg Junction temperature Operating temperature range Storage temperature range Parameter Value 125 -40 to + 85 -55 to +150 Unit C C C
Table 3: Electrical Characteristics (Tamb = 25C) Symbol VBR IRM VRM VCL Rd IPP RI/O Cline Parameter Breakdown voltage Leakage current @ VRM Stand-off voltage Clamping voltage Dynamic resistance Peak pulse current Series resistance between Input & Output Input capacitance per line
IPP VBR VCL VRM IRM IR VF V I IF
Symbol VBR IRM RI/O Cline IR = 1 mA
Test conditions
Min. 6
Typ. 8
Max. 10 200
Unit V nA
VRM = 3V per line Tolerance 10% VR= 3V 160 13
15
pF
Figure 3: S21(dB) attenuation measurement
0.00 dB - 10.00
Figure 4: Analog cross talk measurements
0.00 dB - 10.00 - 20.00 - 30.00
- 20.00
- 40.00 - 50.00
- 30.00
- 60.00 - 70.00
- 40.00
- 80.00 - 90.00
- 50.00 100.0k 1.0M 10.0M f/Hz 100.0M 1.0G
- 100.00 100.0k 1.0M 10.0M f/Hz 100.0M 1.0G
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EMIF04-1502QCF
Figure 5: ESD response to IEC61000-4-2 (+15kV air discharge) on one input (Vin) and on one output (Vout)
Figure 6: ESD response to IEC61000-4-2 (-15kV air discharge) on one input (Vin) and on one output (Vout)
Vin
C1=10V/d 100ns/d
C1=10V/d
Vin
C2=5V/d 100ns/d
100ns/d
Vout
C2=5V/d
Vout
100ns/d
Figure 7: Line capacitance versus applied voltage (typical value)
Cline (pF)
25 20 15 10 5 0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Vline (V)
Figure 8: Ordering Information Scheme
EMIF
EMI Filter Number of lines Information x = resistance value (Ohms) z = capacitance value / 10(pF) or 3 letters = application 2 digits = version Package QCF = QFN 2mm x 2mm
yy
-
xxx z
QCF
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EMIF04-1502QCF
Figure 9: QFN Package Mechanical Data
L2
REF.
E
L2 D
A A1 e b
A2 A3
L r b1 E2 W r1 D2
A A1 A2 A3 b b1 D D2 E E2 e L L2 r r1 W
Degress
DIMENSIONS Millimeters Inches Min. Typ. Max. Min. Typ. Max. 0.80 0.90 1.00 0.032 0.035 0.039 0.03 0.05 0.001 0.002 0.65 0.70 0.75 0.026 0.028 0.030 0.15 0.20 0.25 0.006 0.008 0.010 0.16 0.18 0.26 0.006 0.007 0.010 0.17 0.30 0.007 0.012 2.00 0.079 0.88 0.98 1.08 0.035 0.039 0.043 2.00 0.079 0.46 0.56 0.66 0.018 0.022 0.026 0.50 0.020 0.20 0.29 0.45 0.008 0.011 0.018 0.13 0.005 0.08 0.003 0.08 0.003 0.20 0.008 0 10 12 0 10 12
Figure 10: Foot Print dimensions (in millimeters)
0.98 1.01
0.33 0.34 0.56 3.00
0.89 0.50 0.28
Table 4: Ordering Information Part Number EMIF04-1502QCF Marking F4 Package QFN Weight 8.4 mg Base qty 3000 Delivery mode Tape & reel (7")
Note: Further packing information available in the application note - AN1751: "EMI Filters: Recommendations and measurements"
Table 5: Revision History Date 06-Dec-2004 Revision 1 First issue Description of Changes
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EMIF04-1502QCF
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics. All other names are the property of their respective owners (c) 2004 STMicroelectronics - All rights reserved STMicroelectronics group of companies Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States of America www.st.com
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